Note: Thermal analog to atomic force microscopy force-displacement measurements for nanoscale interfacial contact resistance

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Note: Thermal analog to atomic force microscopy force-displacement measurements for nanoscale interfacial contact resistance.

Thermal diffusion measurements on polymethylmethacrylate-coated Si substrates using heated atomic force microscopy tips were performed to determine the contact resistance between an organic thin film and Si. The measurement methodology presented demonstrates how the thermal contrast signal obtained during a force-displacement ramp is used to quantify the resistance to heat transfer through an i...

متن کامل

Nanoscale mechanics by tomographic contact resonance atomic force microscopy.

We report on quantifiable depth-dependent contact resonance AFM (CR-AFM) measurements over polystyrene-polypropylene (PS-PP) blends to detail surface and sub-surface features in terms of elastic modulus and mechanical dissipation. The depth-dependences of the measured parameters were analyzed to generate cross-sectional images of tomographic reconstructions. Through a suitable normalization of ...

متن کامل

Effective Parameters in Contact Mechanic for Micro/nano Particle Manipulation Based on Atomic Force Microscopy

The effect of geometry and material of the Micro/Nano particle on contact mechanic for manipulation was studied in this work based on atomic force microscopy. Hertz contact model simulation for EpH biological micro particle with spherical, cylindrical, and circular crowned roller shape was used to investigate the effect of geometry on contact simulation process in manipulation. Then, to val...

متن کامل

Contact-resonance atomic force microscopy for viscoelasticity

We present a quantitative method for determining the viscoelastic properties of materials with nanometer spatial resolution. The approach is based on the atomic force acoustic microscopy technique that involves the resonant frequencies of the atomic force microscopy cantilever when its tip is in contact with a sample surface. We derive expressions for the viscoelastic properties of the sample i...

متن کامل

Finite Element Simulation of Contact Mechanics of Cancer Cells in Manipulation Based on Atomic Force Microscopy

The theory of contact mechanics deals with stresses and deformations which arise when the surfaces of two solid bodies are brought into contact. In elastic deformation contact occurs over a finite area. A regular method for determining the dimensions of this area is Hertz Contact Model. Appearance of atomic force microscope results in introduction of Contact ...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Review of Scientific Instruments

سال: 2010

ISSN: 0034-6748,1089-7623

DOI: 10.1063/1.3361157